Space debris observationThe presence of space waste(space debris)left in orbit around the earth is becoming a space environmental problem.
各種半導体部品や機器の宇宙環境下での特性を広く把握し、今後の宇宙開発につなげます。
Various semiconductor parts and characteristics under the space environment of the equipment are widely understood, and it ties to the space development in the future.
Introduction of research and development on the space system(satellite system, launch system, ground system,satellite remote sensing and space environment use).
United States, Canada and European countries have developed the space environment utilization researches since early 1980s by the Space Shuttle flights.
The first change isgreater convenience for those of us living on the earth with the aid of the cosmic environment.
実験報告によると、「BEARテストは加速器技術が宇宙環境に適応できることが証明されています。
The experiment report described it as modestly successful:“The BEAR flight has demonstrated thataccelerator technology can be adapted to a space environment.
The simulation of the space environment for the AOCS of a satellite is executed on the dSPACE SCALEXIO simulation platform.
ようやく消費電力と費用に見合う、宇宙環境でも使用可能な部品調達が可能になったわけです。
At long last,it becomes possible to obtain electrical components usable in the space environment, while meeting the requirements of power consumption and cost.
Regarding the space environment utilization, establishment of the database of commercial parts and technologies, establishment of the selection/evaluation and application guideline, and the preparation and promotion of the USERS user manual were conducted.
Space environment data obtained on orbit will be used as fundamental data for designing space-related equipment, as well as for related science experiments, operation of the ISS, and space weather forecasting prediction of the solar activities.
At the USERS project, pin pointed return of the results if the on-orbit experiment was successfully performed,and established the space environment utilization infrastructure.
At HIREC, we conduct temperature cycling test in conformity with MIL-STD-883 Method 1010 to verify the resistance properties of electronic parts against the high andlow temperature cycles in the space environment.
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