The ADF5610 is manufactured using Analog Devices' proprietary advanced silicon germanium(SiGe)BiCMOS process with low bit error rate.
影响误码率的大小,和传输距离的长短,以及系统速率的大小。
Affects the size of the bit error rate, the length of the transmission distance, and the size of the system.
如图1所示,这些高速I/O接口需要低抖动定时参考,以最大限度地降低误码率并提高整体系统性能。
As shown in Figure 1, these high-speed I/O interfacesrequire low-jitter timing references to minimize bit-error rate and improve overall system performance.
此外,还必须进行网络端到端的鉴定,这时会执行所有相关的SONET/SDH测试,包括误码率等测试。
Furthermore, network end-to-end level qualification is required where all the relevant SONET/SDH tests are performed,including tests such as bit error rate.
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