Eksempler på bruk av Atomic force på Engelsk og deres oversettelse til Norsk
{-}
-
Colloquial
-
Ecclesiastic
-
Ecclesiastic
-
Computer
They did this with an atomic force microscope.
Atomic force microscope image of InAs self-assembled quantum dots on a GaAs surface.
Dr. Forrester believes they generate atomic force.
The atomic force microscope(AFM) has become one of the standard tools of nanotechnology.
You will use different types of optical spectroscopy and work with atomic force microcopy.
This tool offers both atomic force(AFM) and scanning tunnelling microscopy(STM) under one hood.
Roger Proksch of Asylum Research,the technology leader in scanning probe/atomic force microscopy(AFM/SPM).
She showed how she has used atomic force spectroscopy to study interactions on the single molecule level.
For example, since these nanotubes are semi-conductors they can be used in products such as advanced high resolution flat panel displays and as tips for atomic force microscopes(AFMs).
Nanosurf is a leading provider of easy-to-use atomic force microscopes(AFM) and scanning tunneling microscopes(STM).
With atomic force microscopy, high-resolution images can be obtained in liquid as the electrochemical reaction progresses.
SOLVER Next is the novel dual head system which offers both atomic force(AFM) and scanning tunnelling microscopy(STM) under one hood.
Atomic force microscope(AFM) has become a well-established technique for imaging single biomolecules under physiological conditions.
The new record was fueled by increasing acceptance of Asylum's Cypher Atomic Force Microscope, the world's highest resolution AFM.
Atomic force microscopy study of structural and functional changes in membrane proteins upon agonist and antagonist binding.
Asylum Research is the technology leader in atomic force and scanning probe microscopy(AFM/SPM) for both materials and bioscience applications.
Atomic Force Microscopy(AFM) technology leader, Asylum Research, is introducing an enhanced Petri Dish Holder and Heater accessory for its MFP-3D AFMs.
These awards have recognized innovations andpioneering developments in multiprobe atomic force microscopy and transparently integrated AFM Raman microspectroscopy.
The use of atomic force microscopy, AFM, provides unique opportunities for the study of soft materials including polymers, polymer melts and solutions.
The Department has selected the JPK ForceRobot 300 system to extend their studies applying atomic force microscopy, AFM, in the measurement of single molecule force spectroscopy.
Atomic force microscopy(AFM) is a powerful tool to investigate a huge variety of different samples with nanometre scale resolution under physiological conditions.
Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy(SPM/AFM), has announced the new Electrochemistry Cell(EC Cell) for its MFP-3D™ AFMs.
Atomic Force Microscopy(AFM) technology leader, Asylum Research, announced it is introducing a new CoolerHeater accessory designed for polymer and other studies where cooling and heating are required.
Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy(SPM/AFM) has announced the new NanoRack™ Sample Stretching Stage Accessory for its MFP-3D™ AFMs.
We also want to thank all our users who so eagerly spread the word andcontinue to drive us to maintain our preeminence as the technology leader in scanning probe and atomic force microscopy.".
Asylum Research, the technology leader for atomic force and scanning probe microscopy(AFM/SPM), announced today that it set new records for both orders and shipments in its third quarter.
Andrew Pelling(University of Ottawa, CA) took mechanical property measurement further simultaneously combining traction force microscopy andlas er scanning confocal microscopy with atomic force microscopy.
Asylum Research, the technology leader for atomic force and scanning probe microscopy(AFM/SPM), announced today that its 2010 sales set a new record, besting its record-breaking 2009 by nearly 20%.
With the nanoIR product we sought to overcome two major barriers--fundamental spatial resolution limits in convention infrared microspectroscopy and the lack of chemical characterization in atomic force microscopy(AFM).
Users of atomic force microscopes, nanomechanical test instrumentation, and all complementary nanomeasurement techniques and technologies are encouraged to submit original paper and poster abstracts.