Eksempler på bruk av Scanning probe på Engelsk og deres oversettelse til Norsk
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High speed, high accuracy five-axis scanning probe.
Communities of scanning probe microscopists and theorists in the physical and life.
It can be used together with SP25 trigger scanning probe.
The new book,"Scanning Probe Microscopy of Functional Materials," edited by Dr.
The combination of Light Microscopy-derived techniques and Scanning Probe Microscopy is a powerful solution.
Limit using scanning probe microscopes- represents an intensely exciting area of.
JPK Instruments hosted the ninth annual international symposium on the applications of scanning probe microscopy(SPM) and optical tweezers.
It is fully automated scanning probe microscope that became new promising trend on the world market.
JPK Instruments recently hosted their tenth annual international symposium on the applications of scanning probe microscopy(SPM) and optical tweezers.
The new building will house a new scanning probe microscope that measures spin-polarized electrons on surfaces.
The scientific training laboratory developed by NT-MDT is a class equipped with several sets of training Scanning Probe Microscopes NanoEducator.
Develop the next generation of scanning probe methods in nanoscience both within.
Classical scanning probe microscopies are based on the excitation and detection of single or, recently, dual frequencies.
Asylum Research is the technology leader in atomic force and scanning probe microscopy(AFM/SPM) for both materials and bioscience applications.
Scanning probe of three dimensional measuring instrument has a good natural frequency, has no motor or mechanical structure, which is suitable for the high speed scan. .
The second largest nanopatterning market, Scanning Probe Lithography, would see its share decline from 2008 to 2015.
JPK Instruments are happy to announce that registration is now open for the tenth annual international symposium on the applications of scanning probe microscopy(SPM) and optical tweezers.
The world market of scanning probe microscopes(SPM) is mainly concentrated in the countries developing their science and innovative technologies.
The coordinate measuring machine has a variety of configurations andsolutions for high accuracy scanning probe, which can be applied to various sizes and configurations CMM.
High precision isolation optical scanning probe measurement system, can directly reflect the deviation of the probe, with better precision and fast dynamic response.
We also want to thank all our users who so eagerly spread the word andcontinue to drive us to maintain our preeminence as the technology leader in scanning probe and atomic force microscopy.".
NT-MDT Co. demonstrated its fully automated scanning probe microscope SOLVER NEXT for a wide range of nanoscale scientific applications.
Global analysis is presented for nanopatterning technologies such as Nanoimprint Lithography(including hot embossing, UV-NIL,Microcontact Printing and others), Scanning Probe Lithography, and Other.
Recent research has produced remarkable progress in the development of scanning probe microscopy and this new book is expected to become a seminal work in the field.
MountainsMap 6 provides modular surface imaging and analysis solutions dedicated to instrument families including confocal microscopes,white light interferometers, scanning probe microscopes, and 2D/3D profilometers.
Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy(SPM/AFM), has announced the new Electrochemistry Cell(EC Cell) for its MFP-3D™ AFMs.
Built and priced especially for university labs and more routine industrial applications, Solver Next provides the flexibility and versatility of over 40 different measurement modes,without the need for advanced training required to run most scanning probe instruments.
Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy(SPM/AFM) has announced the new NanoRack™ Sample Stretching Stage Accessory for its MFP-3D™ AFMs.
Developed by Oak Ridge National Laboratory(ORNL) and Asylum Research,ESM is an innovative scanning probe microscopy(SPM) technique capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level.
The LT-SPM is a multi-functional scanning probe microscope devoted to the high-resolution properties of spin-polarized surfaces at high magnetic fields(9 T) and low temperatures(4.2 K).