Examples of using Lateral resolution in English and their translations into German
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High lateral resolution for measuring short wavelengths.
Excellent diffraction limited lateral resolution of 200- 300 nm.
Lateral resolution(depending on field of view): 0,2-3 µm.
Greater vertical and lateral resolution, higher precision e. g.
Micro-electrochemical investigation with high lateral resolution.
For wavelengths, lateral resolution and bandwidths see vis 4QD detector.
Surface characterization with confocal mode, lateral resolution< 140 nm.
The lateral resolution provided in this microscopy is around 166nm.
It is possible to measure nanometer displacements with a lateral resolution in the micrometer range.
Thereby, the lateral resolution achieves an accuracy of 5 μm and the height resolution achieves an accuracy of up to 0.11 μm.
You benefit from excellent height resolving power in combined with superior lateral resolution.
Combined with microscopy chemical images with a lateral resolution in the micrometer range can be measured.
Due to the high light-throughput a very high sensitivity is reached even at the highest lateral resolution.
High definition confocal microscopy for high lateral resolution and interferometry to reach sub-nanometer vertical resolution. .
With the TMS-1200 TopMap Âμ. Lab,you can characterize microstructures' surfaces with a very high lateral resolution.
The excellent image quality and good lateral resolution make them ideal instruments for the visualization of morphological film parameters e. g.
For the determination of the lateral magnification or the lateral resolution of a microscope.
The UHF-120's high lateral resolution of less than 1 Âμm is decisive particularly for visualizing the surface waves of SAW(surface acoustic wave) components.
One laser scanner(Konica-Minolta VI-910)which works with triangulation technology and has a lateral resolution of max.
FTIR imaging allows the spectroscopic examination of samples with a lateral resolution that is only limited by the wavelength dependent diffraction of light.
Depending on the requirements of your application,you can select prisms for higher contrast or increased lateral resolution.
If high lateral resolution is required, microscope systems are more suitable, where the optical configuration including the reference arm is integrated into the objective.
Scanning Near-field Optical Microscopy(SNOM): Optical imaging with resolution beyond the diffraction limit 60-100 nm lateral resolution.
The lateral resolution is approx. 30 µm. During the data acquisition time of approximately 30 seconds, the entire surface of the asphere is measured at a high lateral resolution and with low measurement uncertainty.
Tip-Enhanced Raman Spectroscopy(TERS) enables the acquisition of chemical information with a lateral resolution far below the diffraction limit.
Depending on the objective the interferometric measurements are performed with an extremeheight resolution in accordance with a very good lateral resolution.
In contrast to conventional coordinate measuring machines(CMM) and micro CMMs, the lateral resolution of the ACP tip is in the case of side walls considerably higher due to their much smaller tip radius r around 20 nm.
This device enables visualisation of the distribution of individual elements or isotopes in solid samples andhas a lateral resolution of up to 50 nm.
The confocal Raman system allows for spectroscopic measurements of molecules andsolids with high spectral and lateral resolution while the integrated atomic force module(AFM) can be used for the topographic characterization of surfaces with nano-scale precision.
Determination of the properties of complex optical materials and surfaces(scattering, textured)from the near IR to the THz range with high lateral resolution.